Omi, Hiroo: search on Z-Library

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1

[IEEE 2019 Compound Semiconductor Week (CSW) - Nara, Japan (2019.5.19-2019.5.23)] 2019 Compound Semiconductor Week (CSW) - Suppressing Interdiffusion of Si in Er-doped CeO 2 / Si(111) and Its Impact on the Optical Property

Inaba, Tomohiro, Xu, Xuejun, Tawara, Takehiko, Omi, Hiroo, Yamamoto, Hideki, Gotoh, Hedeki

Year:

2019

File:

PDF, 4.54 MB

2019

2

Effect of isotopic purification on spectral-hole narrowing in 167 Er 3+ hyperfine transitions

Tawara, Takehiko, Mariani, Giacomo, Shimizu, Kaoru, Omi, Hiroo, Adachi, Satoru, Gotoh, Hideki

Journal:

Applied Physics Express

Year:

2017

Language:

english

File:

PDF, 4.63 MB

english, 2017

3

[IEEE 2012 IEEE 9th International Conference on Group IV Photonics (GFP) - San Diego, CA, USA (2012.08.29-2012.08.31)] The 9th International Conference on Group IV Photonics (GFP) - Light emission from thulium silicates for optical amplifiers on silicon in extended optical communication bands

Omi, Hiroo, Hagiwara, Atsushi, Tawara, Takehiko

Year:

2012

Language:

english

File:

PDF, 244 KB

english, 2012

4

Growth-induced atomic step ordering on patterned and non-patterned Si(111)

Hiroo Omi, Toshio Ogino

Journal:

Thin Solid Films

Year:

2000

Language:

english

File:

PDF, 1.21 MB

english, 2000

5

Mixture formation of ErxYb2-xSi2O7 and ErxYb2-xO3 on Si for broadening the C-band in an optical amplifier

Omi, Hiroo, Abe, Yoshiyuki, Anagnosti, Maria, Tawara, Takehiko

Journal:

Year:

2013

Language:

english

File:

PDF, 1.11 MB

english, 2013

6

Investigation of Population Dynamics in 1.54-μm Telecom Transitions of Epitaxial (ErxSc1-x)2O3 Thin Layers for Coherent Population Manipulation: Weak Excitation Regime

Adachi, Satoru, Kawakami, Yoshihiro, Kaji, Reina, Tawara, Takehiko, Omi, Hiroo

Journal:

Applied Sciences

Year:

2018

Language:

english

File:

PDF, 1.65 MB

english, 2018

7

Ge molecular beam epitaxy on Si(113): surface structures, nanowires and nanodots

Zhaohui Zhang, Koji Sumitomo, Hiroo Omi, Toshio Ogino, Xing Zhu

Journal:

Surface and Interface Analysis

Year:

2004

Language:

english

File:

PDF, 341 KB

english, 2004

8

Structural stability of the Ge/Si(1 1 3)-2×2 surface

Jun Nakamura, Zhaohui Zhang, Koji Sumitomo, Hiroo Omi, Toshio Ogino, Akiko Natori

Journal:

Applied Surface Science

Year:

2003

Language:

english

File:

PDF, 359 KB

english, 2003

9

Fabrication and Integration of Nanostructures on Si Surfaces

Ogino, Toshio, Hibino, Hiroki, Homma, Yoshikazu, Kobayashi, Yoshihiro, Prabhakaran, Kuniyil, Sumitomo, Koji, Omi, Hiroo

Journal:

Accounts of Chemical Research

Year:

1999

Language:

english

File:

PDF, 194 KB

english, 1999

10

Design of atomic step networks on Si(111) through strain distribution control

Journal:

Journal of Applied Physics

Year:

2004

Language:

english

File:

PDF, 717 KB

english, 2004

11

Preface

Shiojima, Kenji, Washio, Katsuyoshi, Miyazaki, Seiichi, Omi, Hiroo

Journal:

Materials Science in Semiconductor Processing

Year:

2020

File:

PDF, 531 KB

2020

12

Self-ordering on vicinal Si(111) during molecular beam epitaxy

Omi, Hiroo, Homma, Yoshikazu

Journal:

Physical Review B

Year:

2005

Language:

english

File:

PDF, 333 KB

english, 2005

13

Self-organization of nanoscale Ge islands in Si/Ge/Si(113) multilayers

Hiroo Omi, Toshio Ogino

Journal:

Applied Surface Science

Year:

1998

Language:

english

File:

PDF, 361 KB

english, 1998

14

Wafer-scale strain engineering on silicon for fabrication of ultimately controlled nanostructures

Omi, Hiroo, Bottomley, David J., Homma, Yoshikazu, Ogino, Toshio

Journal:

Physical Review B

Year:

2003

Language:

english

File:

PDF, 2.03 MB

english, 2003

15

Strain Analysis of Silicon Nanolayers by Grazing Incidence X-ray Diffraction

OMI, Hiroo, KAWAMURA, Tomoaki, KOBAYASHI, Yoshihiro, FUJIKAWA, Seiji, TSUSAKA, Yoshiyuki, KAGOSHIMA, Yasushi, MATSUI, Junji

Journal:

Year:

2007

File:

PDF, 526 KB

2007

16

In-plane strain distribution in the surface region of thin silicon overlayers on insulator

Omi, Hiroo, Kawamura, Tomoaki, Fujikawa, Seiji, Tsusaka, Yoshiyuki, Kagoshima, Yasushi, Matsui, Junji

Journal:

Applied Physics Letters

Year:

2005

Language:

english

File:

PDF, 382 KB

english, 2005

17

[OSA CLEO: Science and Innovations - San Jose, California (2015..-..)] CLEO: 2015 - Visible up-conversion luminescence in (ErSc)_2O_3 epitaxial thin films and its suppression by photonic band-gap

Tawara, Takehiko, McManus, Thomas, Kawakami, Yoshihiro, Omi, Hiroo, Najar, Adel, Kaji, Reina, Adachi, Satoru, Gotoh, HIdeki

Year:

2015

Language:

english

File:

PDF, 1.57 MB

english, 2015

18

Stability-instability transition of reaction fronts in thermal oxidation of silicon

Omi, Hiroo, Kageshima, Hiroyuki, Kawamura, Tomoaki, Uematsu, Masashi, Kobayashi, Yoshihiro, Fujikawa, Seiji, Tsusaka, Yoshiyuki, Kagoshima, Yasushi, Matsui, Junji

Journal:

Physical Review B

Year:

2009

Language:

english

File:

PDF, 577 KB

english, 2009

19

Epitaxial growth and optical properties of Er-doped CeO 2 on Si(111)

Inaba, Tomohiro, Tawara, Takehiko, Omi, Hiroo, Yamamoto, Hideki, Gotoh, Hideki

Journal:

Optical Materials Express

Year:

2018

Language:

english

File:

PDF, 2.70 MB

english, 2018

20

ChemInform Abstract: Fabrication and Integration of Nanostructures on Si Surfaces

Toshio Ogino, Hiroki Hibino, Yoshikazu Homma, Yoshihiro Kobayashi, Kuniyil Prabhakaran, Koji Sumitomo, Hiroo Omi

Journal:

Year:

1999

File:

PDF, 24 KB

1999

21

Self-organization of Ge islands on high-index Si substrates

Omi, Hiroo, Ogino, Toshio

Journal:

Physical Review B

Year:

1999

Language:

english

File:

PDF, 1.10 MB

english, 1999

22

On the role of substrate in light-harvesting experiments

Sychugov, Ilya, Omi, Hiroo, Kobayashi, Yoshihiro

Journal:

Year:

2008

Language:

english

File:

PDF, 423 KB

english, 2008

23

Energy Transfers between Er$^{3+}$ Ions Located at the Two Crystalographic Sites of Er$_{2}$O$_{3}$ Grown on Si(111)

Omi, Hiroo, Tawara, Takehiko

Journal:

Japanese Journal of Applied Physics

Year:

2012

Language:

english

File:

PDF, 535 KB

english, 2012

24

Surface

Zhang, Zhaohui, Sumitomo, Koji, Omi, Hiroo, Ogino, Toshio, Nakamura, Jun, Natori, Akiko

Journal:

Physical Review Letters

Year:

2002

Language:

english

File:

PDF, 886 KB

english, 2002

25

Scandium effect on the luminescence of Er-Sc silicates prepared from multi-nanolayer films

Adel Najar,Hiroo Omi,Takehiko Tawara

Journal:

Nanoscale Research Letters

Year:

2014

Language:

english

File:

PDF, 1016 KB

english, 2014

26

Real-Time Analyses of Strain in Ultrathin Silicon Nanolayers on Insulators during Thermal Oxidation

Omi, Hiroo, Kawamura, Tomoaki, Kobayashi, Yoshihiro, Fujikawa, Seiji, Tsusaka, Yoshiyuki, Kagoshima, Yasushi, Matsui, Junji

Journal:

Applied Physics Express

Year:

2009

Language:

english

File:

PDF, 172 KB

english, 2009

27

during Molecular Beam Epitaxy: Scaling and Universality

Omi, Hiroo, Homma, Yoshikazu, Tonchev, Vesselin, Pimpinelli, Alberto

Journal:

Physical Review Letters

Year:

2005

Language:

english

File:

PDF, 309 KB

english, 2005

28

[IEEE 2019 Compound Semiconductor Week (CSW) - Nara, Japan (2019.5.19-2019.5.23)] 2019 Compound Semiconductor Week (CSW) - Evaluation of Rabi frequency and coherence time in the hyperfine structure of 167 Er 3+ in Y 2 SiO 5 through coherent transients

Hiraishi, Masaya, IJspeert, Mark, Tawara, Takehiko, Adachi, Satoru, Omi, Hiroo, Gotoh, Hideki

Year:

2019

Language:

english

File:

PDF, 2.98 MB

english, 2019

29

Scaling and Universality of Roughening in Thermal Oxidation of Si(001)

Omi, Hiroo, Kageshima, Hiroyuki, Uematsu, Masashi

Journal:

Physical Review Letters

Year:

2006

Language:

english

File:

PDF, 311 KB

english, 2006

30

Simultaneous light emissions from erbium-thulium silicates and oxides on silicon in the second and third telecommunications bands

Anagnosti, Maria, Omi, Hiroo, Tawara, Takehiko

Journal:

Optical Materials Express

Year:

2014

Language:

english

File:

PDF, 1.37 MB

english, 2014

31

[OSA CLEO: Applications and Technology - San Jose, California (2014..-..)] CLEO: 2014 - Structural characterization and luminescence properties of ErxSc2-xSi2O7 prepared by RF sputtering

Najar, Adel, Tawara, Takehiko, Omi, Hiroo

Year:

2014

Language:

english

File:

PDF, 444 KB

english, 2014

32

[IEEE 2016 Compound Semiconductor Week (CSW) [Includes 28th International Conference on Indium Phosphide & Related Materials (IPRM) & 43rd International Symposium on Compound Semiconductors (ISCS)] - Toyama, Japan (2016.6.26-2016.6.30)] 2016 Compound Semiconductor Week (CSW) [Includes 28th International Conference on Indium Phosphide & Related Materials (IPRM) & 43rd International Symposium on Compound Semiconductors (ISCS) - Photonic crystal membrane with single crystalline rare-earth oxide using selective area growth by MBE

Tawara, Takehiko, Omi, Hiroo, McManus, Thomas, Llenas, Aleix, Kuramochi, Eiichi, Adachi, Satoru, Gotoh, Hideki

Year:

2016

Language:

english

File:

PDF, 17 KB

english, 2016

33

Influences of the Si(1 1 3) anisotropy on Ge nanowire formation and related island shape transition

Zhaohui Zhang, Koji Sumitomo, Hiroo Omi, Toshio Ogino

Journal:

Surface Science

Year:

2002

Language:

english

File:

PDF, 290 KB

english, 2002

34

Anisotropic strain relaxation of Ge nanowires on Si(113) studied by medium-energy ion scattering

Sumitomo, Koji, Omi, Hiroo, Zhang, Zhaohui, Ogino, Toshio

Journal:

Physical Review B

Year:

2003

Language:

english

File:

PDF, 197 KB

english, 2003

35

Mechanism of concentration quenching in epitaxial (Er_xSc_1-x)_2O_3 thin layers

Tawara, Takehiko, Kawakami, Yoshihiro, Omi, Hiroo, Kaji, Reina, Adachi, Satoru, Gotoh, Hideki

Journal:

Optical Materials Express

Year:

2017

Language:

english

File:

PDF, 3.44 MB

english, 2017

36

Positioning of self-assembling Ge islands on Si(111) mesas by using atomic steps

Hiroo Omi, Toshio Ogino

Journal:

Thin Solid Films

Year:

2000

Language:

english

File:

PDF, 335 KB

english, 2000

37

Light emission from thulium silicates and oxides for optical amplifiers on silicon in the extended optical communications band

Omi, Hiroo, Hagiwara, Atsushi, Tawara, Takehiko

Journal:

Year:

2013

Language:

english

File:

PDF, 691 KB

english, 2013

38

Polarity propagation in the InSb/α-Sn/InSb heterostructure

Omi, Hiroo, Saito, Hideaki, Osaka, Toshiaki

Journal:

Physical Review Letters

Year:

1994

Language:

english

File:

PDF, 375 KB

english, 1994

39

Modeling tip performance for combined STM-luminescence and aperture-SNOM scanning probe: Spatial resolution and collection efficiency

Ilya Sychugov, Hiroo Omi, Tooru Murashita, Yoshihiro Kobayashi

Journal:

Applied Surface Science

Year:

2008

Language:

english

File:

PDF, 494 KB

english, 2008

40

Shape of atomic steps on Si(111) under localized stress

Omi, Hiroo, Bottomley, David J., Homma, Yoshikazu, Ogino, Toshio, Stoyanov, Stoyan, Tonchev, Vesselin

Journal:

Physical Review B

Year:

2002

Language:

english

File:

PDF, 264 KB

english, 2002

41

[IEEE 2019 24th OptoElectronics and Communications Conference (OECC) and 2019 International Conference on Photonics in Switching and Computing (PSC) - Fukuoka, Japan (2019.7.7-2019.7.11)] 2019 24th OptoElectronics and Communications Conference (OECC) and 2019 International Conference on Photonics in Switching and Computing (PSC) - Horizontal Slot Waveguides with Strong Optical Confinement in Low Refractive Index Oxide Films

Xu, Xuejun, Inaba, Tomohiro, Tawara, Takehiko, Omi, Hiroo, Gotoh, Hideki

Year:

2019

File:

PDF, 1.49 MB

2019

42

Structure transition of Ge/Si(1 1 3) surfaces during Ge epitaxial growth

Zhaohui Zhang, Koji Sumitomo, Feng Lin, Hiroo Omi, Toshio Ogino

Journal:

Physica E: Low-dimensional Systems and Nanostructures

Year:

2004

Language:

english

File:

PDF, 419 KB

english, 2004

43

Spin splitting in EuO(111)/Si(111) spin-filter tunnel junctions with atomically sharp interface

Ohsugi, Rento, Omi, Hiroo, Krockenberger, Yoshiharu, Fujiwara, Akira

Journal:

Japanese Journal of Applied Physics

Year:

2018

Language:

english

File:

PDF, 660 KB

english, 2018

44

Strain Analysis of Silicon Nanolayers by Grazing Incidence X-ray Diffraction

OMI, Hiroo, KAWAMURA, Tomoaki, KOBAYASHI, Yoshihiro, FUJIKAWA, Seiji, TSUSAKA, Yoshiyuki, KAGOSHIMA, Yasushi, MATSUI, Junji

Journal:

Year:

2007

File:

PDF, 526 KB

2007

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